Universitäre Service-Einrichtung für Transmissionselektronenmikroskopie
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FEI TECNAI F20

FEI TECNAI F20 (60 kV - 200 kV EELS) (2001)
FEI TECNAI F20 (60 kV - 200 kV EELS) (2014)

Location: DB08G03
Tel.: 45215
Person of responsibility: Dr. Michael Stöger-Pollach

Applications and research:

  • Imaging and STEM
  • Dichroism experiments
  • Investigations of semiconductors (VEELS)
  • Low Voltage (60 keV) EELS
  • Service
  • HRTEM
  • Chemical microanalysis with high spatial resolution
  • structure analysis using electron diffraction techniques
  • CL - cathodoluminescence

Special add-ons: bi-prisma in C2 position (optional),
B-field reversal unit of objective lens, vortex apertures in C1, C2 and SAD,
Bessel-beam aperture in C2

Specifications:

EmitterFEG
operation voltage60 kV - 200 kV
EELS/EFTEMGIF Tridiem
EDXEDAX Apollo XLTW SDD, <129 eV resolution
STEMyes
HAADFyes
GATAN VULCAN CL spectrometeryes
GATAN Orius 600bottom mount CCD
GATAN DigiStem IIyes
Lattice resolution0.14 nm
Point resolution0.21 nm
Energy resolution @ 200 kV0.7 eV
Energy resolution @ 60 kV0.5 eV
Line resolution in EDX136 eV

 

Specimen holder:

Single tiltyes
Double tilt (low background)yes
Double tilt rotation yes(+/- 35°)
Cryo transfer double tiltyes
Double tilt heating (1000°C)yes(+/- 30°)